<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.2d1 20170631//EN" "JATS-journalpublishing1.dtd">
<ArticleSet>
  <Article>
    <Journal>
      <PublisherName>ijesm</PublisherName>
      <JournalTitle>International Journal of Engineering, Science and</JournalTitle>
      <PISSN>I</PISSN>
      <EISSN>S</EISSN>
      <Volume-Issue>Volume 7, Issue 4 (2) </Volume-Issue>
      <PartNumber/>
      <IssueTopic>Multidisciplinary</IssueTopic>
      <IssueLanguage>English</IssueLanguage>
      <Season>April 2018 (Special Issue FBSA)</Season>
      <SpecialIssue>N</SpecialIssue>
      <SupplementaryIssue>N</SupplementaryIssue>
      <IssueOA>Y</IssueOA>
      <PubDate>
        <Year>-0001</Year>
        <Month>11</Month>
        <Day>30</Day>
      </PubDate>
      <ArticleType>Engineering, Science and Mathematics</ArticleType>
      <ArticleTitle>Atomic Force Microscopy (AFM) and Its Uses</ArticleTitle>
      <SubTitle/>
      <ArticleLanguage>English</ArticleLanguage>
      <ArticleOA>Y</ArticleOA>
      <FirstPage>88</FirstPage>
      <LastPage>97</LastPage>
      <AuthorList>
        <Author>
          <FirstName>Debolina</FirstName>
          <LastName>Mitra</LastName>
          <AuthorLanguage>English</AuthorLanguage>
          <Affiliation/>
          <CorrespondingAuthor>N</CorrespondingAuthor>
          <ORCID/>
        </Author>
      </AuthorList>
      <DOI/>
      <Abstract>The basic principles of atomic force microscope are discussed. The mode of imaging and the mode of operation are described and compared with each other. Finally, a detail analysis on the application of atomic force microscope in the field of nanoscience, biological molecules and surfactants are discussed and the relevant experimental work is summarized.</Abstract>
      <AbstractLanguage>English</AbstractLanguage>
      <Keywords>Contact; Tapping; Topography; Phase; Force.</Keywords>
      <URLs>
        <Abstract>https://ijesm.co.in/ubijournal-v1copy/journals/abstract.php?article_id=5396&amp;title=Atomic Force Microscopy (AFM) and Its Uses</Abstract>
      </URLs>
      <References>
        <ReferencesarticleTitle>References</ReferencesarticleTitle>
        <ReferencesfirstPage>16</ReferencesfirstPage>
        <ReferenceslastPage>19</ReferenceslastPage>
        <References/>
      </References>
    </Journal>
  </Article>
</ArticleSet>