International Journal of Engineering, Science and Mathematics
(IJMRA Publications)-
Peer Reviewed Refereed Journal


Pages: 88-97

Date of Publication: 30-Nov--0001

Atomic Force Microscopy (AFM) and Its Uses

Author: Debolina Mitra

Category: Engineering, Science and Mathematics

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The basic principles of atomic force microscope are discussed. The mode of imaging and the mode of operation are described and compared with each other. Finally, a detail analysis on the application of atomic force microscope in the field of nanoscience, biological molecules and surfactants are discussed and the relevant experimental work is summarized.

Keywords: Contact; Tapping; Topography; Phase; Force.